Report Categories

An Argon Ion Cross Section Polisher (CP) is a specialized device used in materials science and microscopy to prepare high-quality cross sections of samples for analysis. It uses a focused beam of argon ions to precisely mill or polish the surface of a sample, revealing its internal structure without causing mechanical damage or introducing artifacts. This technique is particularly useful for preparing brittle, heterogeneous, or composite materials that are difficult to section using traditional mechanical methods. Argon ion cross section polishers are commonly employed in scanning electron microscopy (SEM) and transmission electron microscopy (TEM) to create clean, smooth cross sections, allowing for detailed examination of microstructures, interfaces, and layers at nanometer scales. The process is widely used in fields like semiconductors, materials engineering, and geology.

USD3480.00

Add To Cart

An Argon Ion Cross Section Polisher (CP) is a specialized device used in materials science and microscopy to prepare high-quality cross sections of samples for analysis. It uses a focused beam of argon ions to precisely mill or polish the surface of a sample, revealing its internal structure without causing mechanical damage or introducing artifacts. This technique is particularly useful for preparing brittle, heterogeneous, or composite materials that are difficult to section using traditional mechanical methods. Argon ion cross section polishers are commonly employed in scanning electron microscopy (SEM) and transmission electron microscopy (TEM) to create clean, smooth cross sections, allowing for detailed examination of microstructures, interfaces, and layers at nanometer scales. The process is widely used in fields like semiconductors, materials engineering, and geology.

USD4480.00

Add To Cart