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Total: 3 records, 1 pages
Search For: Logic Test Probe Card
Global Logic Test Probe Card Supply, Demand and Key Producers, 2024-2030
01 Mar 2024
Electronics & Semiconductor
The global Logic Test Probe Card market size is expected to reach $ 1977.3 million by 2030, rising at a market growth of 8.6% CAGR during the forecast period (2024-2030).
USD4480.00
Add To Cart
Global Logic Test Probe Card Market 2024 by Manufacturers, Regions, Type and Application, Forecast to 2030
02 Jan 2024
Electronics & Semiconductor
According to our (Global Info Research) latest study, the global Logic Test Probe Card market size was valued at USD 1108.9 million in 2023 and is forecast to a readjusted size of USD 1977.3 million by 2030 with a CAGR of 8.6% during review period.
USD3480.00
Add To Cart
Global Logic Test Probe Card Market 2023 by Manufacturers, Regions, Type and Application, Forecast to 2029
18 Mar 2023
Electronics & Semiconductor
A Logic Test Probe Card is an interface between an electronic test system and a semiconductor wafer. Typically the Logic Test Probe Card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged.
USD3480.00
Add To Cart
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With better results and higher quality products,Our professional reports can achieve four things:
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Search For: Logic Test Probe Card
Total: 3 records, 1 pages
The global Logic Test Probe Card market size is expected to reach $ 1977.3 million by 2030, rising at a market growth of 8.6% CAGR during the forecast period (2024-2030).
USD4480.00
Add To Cart
According to our (Global Info Research) latest study, the global Logic Test Probe Card market size was valued at USD 1108.9 million in 2023 and is forecast to a readjusted size of USD 1977.3 million by 2030 with a CAGR of 8.6% during review period.
USD3480.00
Add To Cart
A Logic Test Probe Card is an interface between an electronic test system and a semiconductor wafer. Typically the Logic Test Probe Card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged.
USD3480.00
Add To Cart
Popular Product Keywords
- We Provide Professional, Accurate Market Analysis to Help You Stay Ahead of Your Competition.Speak to our analyst >>
Our Clients
What We Can Provide?
With better results and higher quality products,Our professional reports can achieve four things:
-
Insight into the industry market information
-
Analyze market development needs
-
Prospects for future development
-
Develop industry investment strategy
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