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Total: 2 records, 1 pages

Global White Light Interferometry System Market 2024 by Manufacturers, Regions, Type and Application, Forecast to 2030

date 06 Sep 2024

date Machinery & Equipment

new_biaoQian White Light Interferometry System

White light interference system is a precision instrument which measures film thickness by using white light interference principle. This system can obtain the information of film thickness by analyzing the interference phenomenon between white light and substrate. White light interferometry has been widely used in thin film thickness measurement because of its non-contact, high accuracy and high speed.

USD3480.00

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Global White Light Interferometry System Supply, Demand and Key Producers, 2024-2030

date 06 Sep 2024

date Machinery & Equipment

new_biaoQian White Light Interferometry System

White light interference system is a precision instrument which measures film thickness by using white light interference principle. This system can obtain the information of film thickness by analyzing the interference phenomenon between white light and substrate. White light interferometry has been widely used in thin film thickness measurement because of its non-contact, high accuracy and high speed.

USD4480.00

Add To Cart

Add To Cart

industry 06 Sep 2024

industry Machinery & Equipment

new_biaoQian White Light Interferometry System

White light interference system is a precision instrument which measures film thickness by using white light interference principle. This system can obtain the information of film thickness by analyzing the interference phenomenon between white light and substrate. White light interferometry has been widely used in thin film thickness measurement because of its non-contact, high accuracy and high speed.

USD3480.00

addToCart

Add To Cart

industry 06 Sep 2024

industry Machinery & Equipment

new_biaoQian White Light Interferometry System

White light interference system is a precision instrument which measures film thickness by using white light interference principle. This system can obtain the information of film thickness by analyzing the interference phenomenon between white light and substrate. White light interferometry has been widely used in thin film thickness measurement because of its non-contact, high accuracy and high speed.

USD4480.00

addToCart

Add To Cart